TEMs 200KV

The new JEM-2100Plus TEM is a multi-purpose Transmission Electron Microscope, combining the proven optic system of the original JEM-2100 with an advanced control system for enhanced ease of operation.

Achieving superior performance through intuitive operation, the JEM-2100Plus provides solutions to a wide range of applications from materials science to medical/biological studies.

The advanced control system allows integration of STEM, EDS, and EELS as well as remote operation.

The JEM-2100Plus features a high-stability goniometer stage specifically tuned for high tilt tomographic applications. An x/y piezo stage is an available option.

The JEM-2100Plus has three independent condenser lenses and produces the highest probe current for any given probe size, which allows for improved analytical and diffraction capabilities. The patented JEOL Alpha Selector™ allows a user the selection of a variety of illumination conditions, ranging from full convergent beam to parallel illumination. The standard incorporation of the objective mini lens means that Lorentz microscopy is a standard feature of this microscope. A high contrast aperture is available for any choice of polepiece, allowing high contrast imaging and simultaneous EDS.

The JEM-2100Plus offers a number of pumping options including full dry-pumped/turbo-pumped versions for lab environments that do not allow for oil-based or rotary pumps.

Features:

• Wide range of selectable objective lenses based upon your application requirements (UHR, HR, HT, HC, Cryo).
• Fine probe analysis and Nano Beam Diffraction. Probe size <1nm.
• Superb and effortless atomic/lattice imaging capabilities <0.14nm with Point-Point resolution guaranteed as low as 0.194nm with the UHR Objective lens.
• Cryo screening capabilities.
• Crystallographic Micro Electron Diffraction option.
• Tomography-capable offering a large range of tilt (¬+80°) and the ability to acquire 3D images with simple operation.

The JEM-F200 "F2" is the only advanced analytical, high throughput 200kV S/TEM in its class to offer a Cold Field Emission Gun and dual Silicon Drift Detectors. The 'F2' employs the newest in JEOL innovations in an easy-to-use, extremely stable, high resolution imaging and analytical 200kV TEM. The F2 is a multi-purpose workhorse system with advanced features not found in any other non-aberration corrected S/TEM.

The boost in probe current from the Cold FEG combined with dual EDS detectors makes the F2 a top performance analytical S/TEM. The high brightness/narrow energy spread of the next-generation JEOL Cold-FEG achieves high energy resolution electron energy loss spectroscopy (EELS) for rapid identification of chemical bonding states. Dual Silicon Drift Detectors (SDD) offer the ultimate high sensitivity and throughput for X-ray analysis. Additionally, the new Advanced Scan System employs De-Scan to achieve wide-field STEM-EELs spectrum imaging.

The F2 features a quad lens condenser system that independently controls electron beam intensity (spot size) and convergence angle.

With more versatility and functionality than ever before in a non-aberration corrected S/TEM, the F2 operation is easier as well. More than 100 beam conditions can be selected at the push of a button, and prior settings can be easily recalled. ECO mode saves power consumption.

A new automated sample holder transfer system, the SpecPorter, makes it easier than ever before to load samples. Once loaded, the PicoStage conducts precise, high speed sample movements of 0.5 nm steps, allowing the operator to move the field of view smoothly over a wide spatial scale range from millimeters to picometers.

Features:

• Quad lens condenser system
• Advanced scan system
• Pico stage drive for ultra-fast, high-precision movement of field-of-view
• SpecPorter automated sample holder transfer system
• Cold FEG with narrow energy spread
• Dual Silicon Drift Detectors
• Intuitive and efficient operation

Cryo-electron microscopy (cryo-EM) has taken enormous flight in recent years. Atomic level structural analysis of viruses and proteins derived by cryo-EM using SPA workflows requires high stability hardware and software. JEOL proudly announces its latest offering in cryo-TEMs to facilitate this development in cryo-EM with the CRYO ARM™ 200. The CRYO ARM™ 200 achieves unprecedented resolution and stability thus allowing for the automatic and unattended acquisition of image data for Single Particle Analysis.

Automated specimen exchange system

The system is composed of an autoloading specimen stage cooled to liquid nitrogen temperatures and a cryo-storage device for long-term storage of up to 12 frozen-hydrated specimens. Liquid nitrogen is automatically supplied to both the stage and storage system as required. The autoloader allows loading of retrieval of up to 4 grids at a time without impacting the remaining samples in the cryo-storage device. Specimens are stored and labeled using a unique system fully transparent to the operator. These unique capabilities enable beamline-like scheduling of microscopy.

Cold field emission gun (Cold FEG)

The cold FEG produces a high-brightness electron beam with a very small energy spread, thus offering high temporal coherency. In addition, spatial coherence is improved resulting in the CRYO ARM™ 200 achieving superior resolution and contrast compared any 200 kV cryo-TEM currently on the market.

In-column energy filter (Omega filter)

Equipped with an improved in-column energy filter (Omega filter), the CRYO ARM™ 200 acquires energy filtered images and energy loss spectra. Zero-loss imaging with the CRYO ARM™ 200 yields data with higher contrast due to reduced chromatic aberration.

Automated image acquisition software for Single Particle Analysis

The CRYO ARM™ 200 incorporates automated software for Single Particle Analysis (SPA) workflows called JADAS. This software allows for automated detection of holes on the specimen grid for automated, unattended acquisition of high-resolution images. Additionally, the CRYO ARM™ 200 is fully compatible with SerialEM (UC Boulder).

Hole-free phase plate

The hole-free phase plate (HFPP) consist of a thin, continuous carbon film placed in the back focal plane of the objective lens, thus providing a substantial improvement in image contrast of frozen-hydrated specimen. Manufacturing of the HFPP uses a unique methodology resulting in robust and reliable performance at reasonable prices.

Auto adjustment functions

Auto focus, auto coma-free alignment, auto parallel-beam illumination and other automated adjustments are available, enabling image acquisition under optimum conditions.

Features:

• Accelerating voltage: 200kV

• Automated specimen exchange system

• Cold field emission gun

• In-column energy filter (Omega filter)

• Automated image acquisition software for single particle analysis

• Hole-free phase plate

• Auto adjustment functions