Tungsten SEMs

The JSM-IT510 InTouchScope™ SEM Series delivers the highest level of intelligent technology with built-in automation for the most versatile analytical SEM available today.

Smart – Flexible – Powerful

Smart – The latest innovations with our InTouchScope™ series SEMs make them accessible at every level. JEOL’s Intelligent Technology delivers seamless navigation from optical to SEM imaging, Live EDS both spectrum and X-ray maps and the best auto functions from alignment to focus for fast, clear, and sharp images. We’ve taken it to the next level with Simple SEM, built-in automation for image collection at multiple locations and conditions. Simple SEM simplifies workflow for the most routine tasks. Our embedded Signal Depth display enhances understanding of analytical spatial resolution. All this technology packed into a compact platform for unprecedented ease-of-use.

Flexible – Choose a platform that is right for you. We offer high vacuum and low vacuum models with or without our Live (embedded) EDS system. [JSM-IT510, JSM-IT510A, JSM-IT510LV, JSM-IT510LA]. This SEM series is equipped with a large specimen chamber that accommodates a wide variety of detectors and accessories such as: EDS, WDS, EBSD, CL, STEM, heating/cooling substages etc.

Powerful – High resolution W filament source (LaB6 option) with unsurpassed low kV performance. The JSM-IT510 includes a large analytical chamber and stage. The stage is mounted inside the chamber enabling users to secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber. Zeromag, with our integrated color camera allows for intuitive navigation to the area of interest and seamless transition to SEM imaging and analysis. All data is linked for instant view of analysis locations. Our new high sensitivity quadrant BSE detector can provide a Live 3D surface reconstruction enhancing your view of specimens with complex topography such as a fracture surface, plating defect, etc. Analytical models include JEOL’s fully embedded EDS system for Real-Time, Live EDS spectra and Live X-ray maps.

Features:

• Specimen Exchange Navi – Integrated step-by-step guide from specimen introduction to automatic image formation.  Unprecedented Ease of Use at any level!
• Zeromag – Simplifies navigation providing a seamless transition from an optical to SEM image.  All data is linked: color image – SEM images – EDS data for map of all analysis locations.
• Live EDS – Full integration of JEOL EDS with Real-Time Live spectrum and Live X-ray map.
• Simple SEM – simplify workflow and automate routine imaging tasks.
• High Vacuum and Low Vacuum with expanded pressure for any sample type.
• Montage – Automate large area image mosaics (stitching) and EDS maps (analytical models).
• Easy Maintenance – no compressed gas required.  Simple source change and Automated Alignments.

Smart – Flexible – Powerful

Smart – The latest innovations with our InTouchScope™ series SEMs make them accessible at every level.

A Specimen Exchange mode guides a new operator step-by-step from sample introduction to automatic condition setting and image formation. JEOL’s intelligent technology delivers best-in-class auto functions from alignment to focus for fast, clear, high-resolution images. With our built-in optical camera for navigation and seamless transition to SEM imaging the workflow is fast and easy. View Live EDS both spectrum and X-ray maps with our analytical models. Take it to the next level with built-in automation, from Montage (large area mosaics) to Simple SEM for automatic image collection at multiple locations, magnifications, and conditions. All this technology is packed into a compact platform for unprecedented ease-of-use.

Flexible – Choose a platform that is right for you. We offer high vacuum and low vacuum models with or without our Live (embedded) EDS system. [JSM-IT210, JSM-IT210A, JSM-IT210LV, JSM-IT210LA].

Powerful – High resolution tungsten source with unsurpassed low voltage performance. Enhanced algorithms for automatic beam alignment, auto focus and stigma correction allow you to focus on results. The high precision, 5-axis motorized stage enhances throughput. Zeromag with its integrated color camera allows for intuitive navigation to the area of interest and seamless transition to SEM imaging and analysis. Our high sensitivity quadrant BSE detector provides a Live 3D surface reconstruction enhancing your view of specimens with complex topography. Analytical models include JEOL’s fully embedded EDS system for Real-Time, Live EDS spectra and Live X-ray maps. Internal Data Management links all data for instant view of analysis locations.

Features

• Specimen Exchange – Integrated step-by-step guide from specimen introduction to automatic image formation. Unprecedented Ease of Use at any level!
• Zeromag – Simplifies navigation providing a seamless transition from an optical to SEM image. All data is linked: color image – SEM images – EDS data for map of all analysis locations.
• Live EDS – Full integration of JEOL EDS with Real-Time Live spectrum and Live X-ray map.
• Automation. Montage – Automate multiple large area image mosaics (stitching) and EDS maps (analytical models). Simple SEM – simplify workflow and automate routine imaging. Recipes for multiple kV, detector, magnifications and more!
• Signal Depth – this function enhances understanding of analytical spatial resolution by displaying the generation depth of characteristic X-ray signals.
• High Vacuum and Low Vacuum models for any sample type. Easy one click transition from High to Low vacuum.
• Easy Maintenance – No special facilities or compressed gas required. Plugs into standard laboratory wall outlet. Simple source change and automated alignments.

This 4th generation NeoScope JCM-7000 incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes.  It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real-time 3D imaging, highly-advanced auto functions and the option to add a fully embedded EDS with real-time, 'Live' analysis.

This 4th generation NeoScope™ is SMART-FLEXIBLE-POWERFUL.

Smart –The latest innovations built to our benchtop platform make this SEM accessible to everyone.  Seamless navigation across the sample allows you to quickly go from an optical image to high resolution SEM imaging and analysis.  Automatic condition setting based on sample type and application ensures high quality results and enhances productivity.  Highly-advanced auto functions generate images of exceptional fidelity.

Flexible – Choose a platform that is right for you.  Add options such as our Stage Navigation System (color camera), fully-embedded EDS for elemental analysis and Smile View Map for 3D image reconstruction and surface texture analysis.

Powerful – The high resolution W filament source allows magnification up to 100,000X.  A benchtop SEM with both secondary electron and backscatter electron detectors, plus high and low vacuum modes allow for the study of a wide variety of sample types.  Automated montage is built-in for high resolution view over a larger area.  Includes montage X-ray map with EDS option.  The BSE detector supports live 3D imaging for intuitive knowledge of sample surface shape.

Live Analysis

Our analytical model includes JEOL's fully embedded EDS system which provides real time EDS spectra during image observation. With Live Analysis you can:

• View EDS spectra in real time as you search for the area of interest.
• Set analysis points, areas, map position and line scan from the live image observation screen.
• View major elements as displayed on the live EDS window.

Features

• Zeromag – Simplifies Navigation and enhances throughput.  Provides a seamless transition from an optical (or holder graphic) to SEM image
• Highly-advanced Auto functions for automatic condition setting and image formation in minutes
• High resolution (100,000X) and large depth of field
• High and low vacuum modes for managing a wide variety of samples
• Large chamber: maximum sample size 80mm (D) x 50mm (H)
• Advanced functions built-in such as: Automated montage and Live 3D Imaging
• Option: Fully embedded EDS with Live (real-time) analysis
• Smile View™ Lab for integrated management of image and analysis data