witec360 Raman Microscope

The Oxford Instruments witec360 is the new benchmark for Raman imaging and correlative microscopy systems, designed to meet the growing demands of academic and industrial researchers for comprehensive analysis at the nanoscale.

The witec360’s modular architecture empowers you to obtain the matching system for your specific experimental challenges. We provide solutions ranging from fixed configurations for single applications to specialised instruments for advanced academic research, as well as tools designed to meet industry standards and multi-user facility demands. Its flexible design ensures that the witec360 evolves and expands with your future requirements.

By integrating correlative techniques, the witec360 expands its analytical capabilities and delivers complementary insights about chemical, topographic, mechanical, and structural properties at the same sample location. Its software ensures user-friendly control, effortless result correlation, and intuitive image overlay for streamlined analysis workflows.

• Atomic Force Microscopy (AFM) - The AFM extension facilitates analysis of material surfaces at the nanometer scale. The integrated design allows for fast, seamless switching between AFM and other measurement modes, while also supporting simultaneous Raman-AFM measurements. With its combined approach, witec360 ensures precise optical alignment and enables convenient correlative imaging of the same sample area for comprehensive analyses in materials science, polymer research, nanotechnology, and life sciences.
• TrueSurface – Topographic Raman Imaging - the pioneering topographic Raman imaging technology uses an advanced optical profilometer integrated within the instrument to provide one-pass simultaneous operation.
• Scanning Near-field Optical Microscopy (SNOM) - For applications requiring optical imaging beyond the diffraction limit, this unique combination facilitates confocal Raman and high-resolution optical imaging, including fluorescence and luminescence analysis of the same region. This allows for efficient and comprehensive analysis of samples including cells, proteins, light-emitting devices, or waveguides.
• Scanning Electron Microscopy (SEM) - a novel correlative microscopy technique (RISE) that combines SEM and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.
• White-light and Fluorescence Microscopy - equipped with a Köhler-illumination setup with optimized optical components for generating white-light images of outstanding quality. We offer different options including bright- and dark-field imaging and differential interference contrast (DIC). White-light microscopy is possible in reflection and transmission modes and can feature polarisation setups. 
• Time-Correlated Single Photon Counting - enables time-correlated single photon counting (TCSPC) measurements. TCSPC records the time-resolved luminescence or fluorescence decay after pulsed stimulation. In Time-resolved Luminescence Microscopy (TLM), the intensity decay is recorded at each image pixel. Various parameters describing each decay can be determined, such as single- or even multi-exponential relaxation times. Images can then be colour-coded according to any of the extracted parameters, revealing local differences in the emission behavior of a sample. For example, extracting the lifetime of fluorophores allows for Fluorescence Lifetime Imaging (FLIM). Combining the time-resolved data with Raman, AFM or SNOM images yields additional information on the investigated materials.
• Second Harmonic Generation (SHG) - a nonlinear optical process that converts two photons of incident light into a single photon of emission. SHG depends on the non-centrosymmetric symmetry of a material’s structure and is highly responsive to variations in crystal orientation, crystal symmetry, layer thickness, and stacking order.